X-ray Photoelectron Spectrometer

The XPS provides chemical state information for compound identification. Its features include:

• Dual Mg/Al anode source Auger and photoelectron separation
• Secondary electron imaging
• Argon Ion gun for surface cleaning and depth profiles (Scanning Auger Microscopy)
• Quadrapole SIMS analysis by Cesium or Oxygen beam

Specification

• Beam Energy for XPS source anode: 12kV; 14mA; spot size 1 mm
• XPS Energy Analyzer (MAC 2): 0.3 - 4.0 eV resolution, constant; acceptance solid angle 6% of 2(pi)
• Electron Gun
• Argon Ion Gun
• Auger Analyzer
• Cesium Source
• Duo Source (Currently Oxygen: O2+ or O-)
• Quadrapole SIMS Analyzer
• Data output to printer, ASCII file or Text

Specimen Considerations

• Vacuum compatible to UHV conditions
• Specimen size 1X1 cm