Variable Pressure Electron Scanning Microscope

The variable pressure of the ESEM allows for imaging of non-conductive specimen without coating. The ESEM has Secondary Electron (SE) detector, Back Scattered Electron (BE) detector, Specimen Current detector, and electron Beam Induced Current (EBIC) detector. The unit also has an EDS detector capable of detecting elements B and up.

Specification

• SEI Resolution: 35 Angstroms @ 30kV in high vacuum mode
• BEI Resolution: 55 Angstroms @ 30kV in variable pressure mode
• Accelerating Voltage: 0.3 - 30 kV
• Magnification: 20X - 300,000X
• Working Distance: 3-60 mm
• Specimen Stage: Eucentric tilt -20 to +90; Rotate 360; x = 80 mm, y = 40 mm, z = 26 mm

Specimen Considerations

• Accommodates wet, oily, non-conductive samples.
• Conductor, Semiconductor, Insulator, biological, polymer, textile, etc.
• Specimen up to 30 mm dia.

Features

• Everhart-Thornley Detector
• Robinson Backscatter Detector
• Absorbed Current Meter
• Digital capture of images with NIH Image software or ISIS software.
• Polaroid 4X5 camera also available