Atomic Force Microscope (JOEL)

Scanner

• Select among four scanners with scan ranges up to 200m square x-y imaging area and up to 10m vertical range
• Sample size up to 15mm diameter and up to 5mm thick
• Tip / Cantilever Holders Tapping Mode (air) Cantilever HolderForce Modulation and Tapping Mode (fluid)
• Electric Force Cantilever Holder
• STM Converter
• Low-Current STM Converter
• Isolation Silicone Vibration Pad
• Acoustic cover

Controller

• Electronics Digital Signal Processor (DSP) with a 20MHz peak rate for arithmetic operations
• x, y, and z scanner drives with 220V range
• Three independent 16-bit DACs on each axis for scan pattern, scaling, and offset
• Scan calibration maintained regardless of scan size or offset
• Calibrated data from both the trace and retrace lines of a scan simultaneously displayed and captured
• Display of both the up-to-down scan and the down-to-up scan for protection against drift artifacts
• x-y electronic noise <1mV peak-to-peak for 10V scan independent of offset
• Four auxiliary DACs, three with 10V outputs and one with 12V and 220V outputs, all with 16-bit resolution
• Two 10V ADCs with 14-bit resolution and software-selectable filters; one input has four-way multiplexing